High-resolution PAT monitoring of sample preparation grinding by accelerometer sensors: the key to ensuring accuracy and long-term consistency

Martin Lischka and André Mehling

DOI: 10.1255/tosf.125

Published in Issue 10 · 2020

Citing this article

Lischka, M. & Mehling, A. (2020). High-resolution PAT monitoring of sample preparation grinding by accelerometer sensors: the key to ensuring accuracy and long-term consistency. TOS forum, 2020(10), 35-40. https://doi.org/10.1255/tosf.125

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